000			00404nam a2200097Ia 4500
008			130131s9999 xx 000 0 und d
245			_aDesign for at-speed test, diagnosis, and measurement / edited by Benoit Nadeau-Dostie.
260			_bBoston : Kluwer Academic, c2000.
300			_axvii, 239 p. : ill. ; 26 cm.
650			_aIntegrated circuits --Testing. Electronic apparatus and appliances --Testing.
999			_c33279 _d32869