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245 _aDesign for at-speed test, diagnosis, and measurement / edited by Benoit Nadeau-Dostie.
260 _bBoston : Kluwer Academic, c2000.
300 _axvii, 239 p. : ill. ; 26 cm.
650 _aIntegrated circuits --Testing. Electronic apparatus and appliances --Testing.
999 _c28488
_d28488
952 _w2012-09-11
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_d2012-09-11
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