000			00493nam a2200109Ia 4500
008			120911s9999 xx 000 0 und d
245			_aDesign for at-speed test, diagnosis, and measurement / edited by Benoit Nadeau-Dostie.
260			_bBoston : Kluwer Academic, c2000.
300			_axvii, 239 p. : ill. ; 26 cm.
650			_aIntegrated circuits --Testing. Electronic apparatus and appliances --Testing.
999			_c28488 _d28488
952			_w2012-09-11 _p18842 _70 _r2012-09-11 _40 _00 _bNU _yOS _10 _d2012-09-11 _aNU