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Results of search for '(su:{Integrated circuits --Testing. Electronic apparatus and appliances --Testing.})'
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Integrated circuits ...
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Design for at-speed test, diagnosis, and measurement / edited by Benoit Nadeau-Dostie.
Material type:
Book
; Format:
print
; Literary form:
Not fiction
Publisher:
Boston : Kluwer Academic, c2000.
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No cover image available
Design for at-speed test, diagnosis, and measurement / edited by Benoit Nadeau-Dostie.
Material type:
Book
; Format:
print
; Literary form:
Not fiction
Publisher:
Boston : Kluwer Academic, c2000.
Availability:
No items available
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(remove)
